Published May 2003
| Version v1
Journal article
Short wavelength X-ray emission generated by high intensity laser irradiation on Xe clusters
Creators
Description
We extend the study of the short wavelength X-ray emission from inner-shell excited states in high-density hot plasmas generated by high intensity laser irradiation on Xe clusters. We discuss the effects of electron densities and temperatures on the X-ray emission. The X-rays are emitted from the inner-shell excited state of highly charged ions (Xe35+) only for the density of more than 3x1023 cm-3 and temperature of more than 5 keV though this density is much larger than that simulated by Ditmire et al. [Phys. Rev. A 53 (1996) 3379]. The X-ray intensity depends on the life-time of the inner-shell excited states
Additional details
Identifiers
- PII
- S0168583X02019900;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 205
- Journal Issue
- 1-4
- Journal Page Range
- p. 346-349
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 11. international conference on the physics of highly charged ions
- Dates
- 1-6 Sep 2002
- Place
- Caen (France)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 34077474
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ATOMIC CLUSTERS; COMPARATIVE EVALUATIONS; ELECTRON DENSITY; EXCITED STATES; HOT PLASMA; INNER-SHELL EXCITATION; IRRADIATION; LASER RADIATION; LIFETIME; MULTICHARGED IONS; PLASMA DENSITY; SIMULATION; TEMPERATURE DEPENDENCE; WAVELENGTHS; X-RAY EMISSION ANALYSIS; XENON; XENON IONS
- Descriptors DEC
- CHARGED PARTICLES; CHEMICAL ANALYSIS; ELECTROMAGNETIC RADIATION; ELEMENTS; ENERGY LEVELS; ENERGY-LEVEL TRANSITIONS; EVALUATION; EXCITATION; FLUIDS; GASES; IONS; NONDESTRUCTIVE ANALYSIS; NONMETALS; PLASMA; RADIATIONS; RARE GASES
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.