Luminescent centres F and F+ in α-alumina detected by cathodoluminescence technique
Creators
Description
α-Al2O3(0 0 0 1) single crystals have been investigated using cathodoluminescence (CL) technique and Auger electron spectroscopy (AES). The main luminescent centres such as F, F+ or Cr3+ activated during the irradiation of crystals by electrons of 4 keV energy were detected and discussed. CL intensity is shown to be highly dependent on both synthesis conditions and thermal annealing treatments. The air-annealing treatments at high temperature (1700 deg. C) reduce considerably the concentration of defects inducing a constant evolution of CL-signal of the band located at 330 nm attributed to F+ defects. On the contrary, crystals not annealed enough display a large increase of the F+ CL-signal during the electron irradiation. The F+ emission is also observed to be very sensitive to electron dose
Additional details
Identifiers
- DOI
- 10.1016/j.elspec.2003.08.003;
- PII
- S0368204803001440;
Publishing Information
- Journal Title
- Journal of Electron Spectroscopy and Related Phenomena
- Journal Volume
- 133
- Journal Issue
- 1-3
- Journal Page Range
- p. 55-63
- ISSN
- 0368-2048
- CODEN
- JESRAW
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 35040907
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ALUMINIUM OXIDES; ANNEALING; AUGER ELECTRON SPECTROSCOPY; CATHODOLUMINESCENCE; ELECTRON BEAMS; F CENTERS; IRRADIATION; MONOCRYSTALS; PHYSICAL RADIATION EFFECTS
- Descriptors DEC
- ALUMINIUM COMPOUNDS; BEAMS; CHALCOGENIDES; COLOR CENTERS; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; CRYSTALS; ELECTRON SPECTROSCOPY; EMISSION; HEAT TREATMENTS; LEPTON BEAMS; LUMINESCENCE; OXIDES; OXYGEN COMPOUNDS; PARTICLE BEAMS; PHOTON EMISSION; POINT DEFECTS; RADIATION EFFECTS; SPECTROSCOPY; VACANCIES
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.