Published 1988 | Version v1
Report Restricted

X-ray response of GaAlAs/GaAs radiation hardened double: Heterostructure photodiode compared to Si:PIN photodiodes

Description

Requirements fro continuous operation of photodiodes in the presence of nuclear radiation has led to the development of a novel GaA1As/GaAs photodiode. Device structure and semi conductor properties of this design were optimized to balance the need for photodetection at λ /equals/ 820 nm against unwanted excess photocurrents induced by ionizing radiation. To achieve radiation hardness the photodiode employs a double heterojunction device structure. The spectral response of this detector, 1 keV to 10 MeV, may offer unique opportunities for use in high-temperature plasma diagnostics compared to typical bare Si:PIN x-ray photodiode characteristics. Application of this GaA1As/GaAs detector in a fiber optic link will be reviewed. Also, use of this detector in simple atomic-absorption-edge filtered x-ray detector channels is presented. 12 refs., 5 figs

Availability note (English)

Available from NTIS, PC A03/MF A01; 1 as DE88007425.

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Additional details

Publishing Information

Imprint Pagination
17 p.
Report number
SAND--88-0089C

Conference

Title
7. topical conference on high temperature plasma diagnostics.
Dates
13-17 Mar 1988.
Place
Napa, CA (USA).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
19093608
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
FIBER OPTICS; PHOTODIODES; PLASMA DIAGNOSTICS; RADIATION HARDENING; RESPONSE FUNCTIONS; SPECIFICATIONS; SPECTRA; X-RAY DETECTION
Descriptors DEC
DETECTION; FUNCTIONS; HARDENING; OPTICS; PHYSICAL RADIATION EFFECTS; RADIATION DETECTION; RADIATION EFFECTS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES

Optional Information

Notes
Portions of this document are illegible in microfiche products.
Secondary number(s)
CONF-880364--7.