Published November 22, 1985
| Version v1
Patent
Ion source operating by surface ionization, noticeably for realization of a ion probe
Description
The ion source includes a neutral particle source, which arrives, on an ionization support realized inside an enclosed space closed by a cap and two lateral walls. A hole in the cap faces a plate which defines an ionization principal active surface. An electric field is applied between the whole device and an electrode set downstream the hole. In its whole, the ionization support defines, a chicane impeding the direct passage of neutral atoms through the exit hole, and contributing to an excellent ionization
Availability note (English)
Available from Institut National de la Propriete Industrielle, Paris (France).Abstract (French)
La source d'ions comporte une source de particules neutres qui arrive sur un support d'ionisation realise a l'interieur d'une enceinte fermee par un capuchon, et les parois laterales. Le capuchon comporte un orifice en regard duquel une plaque definit une surface active principale d'ionisation. Un champ electrique est applique entre l'ensemble de ce dispositif et une electrode placee en aval de l'orifice dans la direction D, munie d'un orifice homologue. Dans son ensemble, le support d'ionisation definit, par la surface active et par des trous perces de maniere decalee dans la plaque, une chicane empechant le passage direct des atomes neutres vers l'orifice de sortie et contribuant a une excellente ionisationAdditional details
Additional titles
- Original title (French)
- Source d'ions operant par ionisation de surface, notamment pour la realisation d'une sonde ionique
Publishing Information
- Imprint Pagination
- 22 p.
- IPC:
- Int. Cl. H01j27/20.
- IPC
- Int. Cl. H01j27/20.
- Patent number
- FR patent document 2564636/A/
INIS
- Country of Publication
- France
- Country of Input or Organization
- France
- INIS RN
- 17047337
- Subject category
- S07: ISOTOPES AND RADIATION SOURCES;
- Resource subtype / Literary indicator
- Non-conventional Literature
- Descriptors DEI
- ADSORPTION; CESIUM IONS; DESORPTION; FOCUSING; ION PROBES; ION SOURCES; NEUTRAL PARTICLES; POTASSIUM IONS; PYROLYSIS; RUBIDIUM IONS; SURFACE IONIZATION; VERY HIGH TEMPERATURE
- Descriptors DEC
- ATOMIC IONS; CHARGED PARTICLES; CHEMICAL REACTIONS; DECOMPOSITION; IONIZATION; IONS; PROBES
Optional Information
- Secondary number(s)
- FR patent application 8407606.