Influence of characteristic x-ray radiation of uranium on the interfering impurity element contents in a uranium matrix
- 1. National Science Center ''Kharkov Institute of Physics and Technology'', Kharkov (Ukraine)
Description
Influence of the characteristic X-ray emission of L and M series uranium on the determination of the contents of interfering elements (Tc, Cd, In, K, Sb, Ho, Co, Er, Rb, Zr, Nb, Mo, Rh) in the uranium matrix was analyzed using a wavelength-dispersive X-ray fluorescence spectrometer S 8 Tiger (Bruker AXS GmbX, Germany). The spectral resolution of the spectrometer (FWHM) was calculated within the X-ray radiation energy range from 1 to 20 keV, the maximum resolution value was calculated as approx 300 eV at the energy of approx 20 keV. The mutual contributions of uranium analytical lines and interfering elements to the total intensity of the unresolved multiplet for different uranium matrices (metal uranium, oxide ceramic fuel, uranium concentrate, waste and scrap) were evaluated. The possibility of direct X-ray fluorescence analysis of samples with uranium content ? 60 wt.% and interfering element contents > 3 wt.% was shown, but the calculation of the most intense uranium lines ULα1, ULβ1, ULβ2 and UMβ are still necessary.
Additional details
Additional titles
- Original title (Russian)
- Влияние характеристического рентгеновского излучения урана на рнтенофлуоресцентное определение содержаний интерферирующих примесных элементов в урановой матрице
Publishing Information
- Journal Title
- Voprosy Atomnoj Nauki i Tekhniki
- Journal Issue
- no.3-115/70
- Journal Page Range
- p. 140-145
- ISSN
- 1562-6016
INIS
- Country of Publication
- Ukraine
- Country of Input or Organization
- Ukraine
- INIS RN
- 49097300
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- FLUORESCENCE SPECTROSCOPY; IMPURITIES; INTERFERING ELEMENTS; MATRIX MATERIALS; URANIUM; X RADIATION; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- ACTINIDES; CHEMICAL ANALYSIS; ELECTROMAGNETIC RADIATION; ELEMENTS; EMISSION SPECTROSCOPY; IONIZING RADIATIONS; MATERIALS; METALS; NONDESTRUCTIVE ANALYSIS; RADIATIONS; SPECTROSCOPY; X-RAY EMISSION ANALYSIS