Published June 1, 2015
| Version v1
Journal article
Molecular dynamics simulations of defect production in graphene by carbon irradiation
Creators
Description
We present molecular dynamics simulations with empirical potentials to study the type of defects produced when irradiating graphene with low energy carbon ions (100 eV and 200 eV) and different dose rates. Simulations show the formation of very stable structures such as dimers, single chains of carbons and double chains of carbons. These structures are similar to those described in the literature, observed experimentally when irradiating graphene. For high doses or dose rates, the formation of nanopores is observed, similar to previous results by other authors for higher energies of the implanted ions. These simulations show how tunning the different parameters of irradiation conditions can be used to selectively create defects in graphene
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nimb.2014.12.010Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2014.12.010;
- PII
- S0168-583X(14)01026-X;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 352
- Journal Page Range
- p. 225-228
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 12. international conference on computer simulation of radiation effects in solids
- Dates
- 8-13 Jun 2014
- Place
- Alcant (Spain)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47037437
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CARBON IONS; DIMERS; DOSE RATES; DOSES; EV RANGE 100-1000; GRAPHENE; IRRADIATION; MOLECULAR DYNAMICS METHOD; SIMULATION
- Descriptors DEC
- CALCULATION METHODS; CARBON; CHARGED PARTICLES; ELEMENTS; ENERGY RANGE; EV RANGE; IONS; NONMETALS
Optional Information
- Copyright
- Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.