Published December 18, 2002
| Version v1
Journal article
Optical system design for high-energy particle beam diagnostics
Creators
- 1. Argonne National Laboratory, 9700 South Cass Avenue, Argonne, IL 60439 (United States)
Description
Radiation generated by high-energy particle beams is widely used to characterize the beam properties. While the wavelengths of radiation may vary from visible to x-rays, the physics underlying the engineering designs are similar. In this tutorial, we discuss the basic considerations for the optical system design in the context of beam instrumentation and the constraints applied by high-radiation environments. We cover commonly used optical diagnostics: fluorescence flags, visible and x-ray synchrotron radiation imaging. Emphases will be on achieving desired resolution, accuracy, and reproducibility
Additional details
Identifiers
- DOI
- 10.1063/1.1524392;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 648
- Journal Issue
- 1
- Journal Page Range
- p. 59-78
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 10. beam instrumentation workshop
- Dates
- 6-9 May 2002
- Place
- Upton, NY (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36064752
- Subject category
- S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACCELERATORS; BEAM MONITORING; BEAM OPTICS; CHARGE-COUPLED DEVICES; DESIGN; DIAGNOSTIC TECHNIQUES; FLUORESCENCE; IMAGES; OPTICAL SYSTEMS; PARTICLE BEAMS; RESOLUTION; SYNCHROTRON RADIATION; X RADIATION
- Descriptors DEC
- BEAMS; BREMSSTRAHLUNG; ELECTROMAGNETIC RADIATION; EMISSION; IONIZING RADIATIONS; LUMINESCENCE; MONITORING; PHOTON EMISSION; RADIATIONS; SEMICONDUCTOR DEVICES
Optional Information
- Notes
- (c) 2002 American Institute of Physics