Published August 2011
| Version v1
Journal article
High resolution extreme ultraviolet spectrometer for an electron beam ion trap
- 1. Institute for Laser Science, University of Electro-Communications, Chofu, Tokyo 182-8585 (Japan)
- 2. National Institute for Fusion Science, Toki, Gifu 509-5292 (Japan)
Description
An extreme ultraviolet spectrometer has been developed for spectroscopic studies of highly charged ions with an electron beam ion trap. It has a slit-less configuration with a spherical varied-line-spacing grating that provides a flat focal plane for grazing incidence light. Alternative use of two different gratings enables us to cover the wavelength range 1-25 nm. Test observations with the Tokyo electron beam ion trap demonstrate the high performance of the present spectrometer such as a resolving power of above 1000.
Additional details
Identifiers
- DOI
- 10.1063/1.3618686;
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 82
- Journal Issue
- 8
- Journal Page Range
- p. 083103-083103.4
- ISSN
- 0034-6748
- CODEN
- RSINAK
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44022917
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- DIFFRACTION GRATINGS; ELECTRON BEAMS; EXTREME ULTRAVIOLET RADIATION; GRATINGS; INCIDENCE ANGLE; ION BEAMS; IONS; PERFORMANCE; RESOLUTION; SPHERICAL CONFIGURATION; TRAPS; ULTRAVIOLET SPECTROMETERS; VISIBLE RADIATION; WAVELENGTHS
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; CONFIGURATION; ELECTROMAGNETIC RADIATION; LEPTON BEAMS; MEASURING INSTRUMENTS; PARTICLE BEAMS; RADIATIONS; SPECTROMETERS; ULTRAVIOLET RADIATION
Optional Information
- Notes
- (c) 2011 American Institute of Physics