Preferred Orientation Enhancement in FeCo/SiO2 Nanocomposite Films Induced by Cu Underlayer
- 1. Jilin Normal University, Key Laboratory of Functional Materials Physics and Chemistry of the Ministry of Education (China)
Description
We prepared FeCo/SiO2 thin films through depositng initial materials on various thickness Cu seed layers by sol-gel spin-coating and magnetron-sputtering methods. As-prepared composite films were reduced in hydrogen to induce texture growth. Structure, magnetic property, and surface topography of the films were characterized by X-ray diffraction (XRD), vibrating sample magnetometer (VSM), and atomic force microscopy (AFM). These experimental data indicate that the ratio values of I(200)/I(110) of the thin films are all larger than 1 for all the samples, indicating that FCC-copper is in favor of promoting (200) FeCo texture, but more thickness will reduce this advantage. Cu underlayers can also promote the out-of-plane magnetic anisotropy of the films.
Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Superconductivity and Novel Magnetism
- Journal Volume
- 31
- Journal Issue
- 7
- Journal Page Range
- p. 2227-2231
- ISSN
- 1557-1939
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 50017181
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Numerical Data
- Descriptors DEI
- ANISOTROPY; ATOMIC FORCE MICROSCOPY; COPPER; EXPERIMENTAL DATA; FCC LATTICES; GRAIN ORIENTATION; HYDROGEN; IRON COMPOUNDS; MAGNETIC PROPERTIES; MAGNETRONS; NANOCOMPOSITES; SILICON OXIDES; SOL-GEL PROCESS; SPIN-ON COATING; SPUTTERING; SURFACES; THIN FILMS; TOPOGRAPHY; VIBRATING SAMPLE MAGNETOMETERS; X-RAY DIFFRACTION
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; CRYSTAL LATTICES; CRYSTAL STRUCTURE; CUBIC LATTICES; DATA; DEPOSITION; DIFFRACTION; ELECTRON TUBES; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; FILMS; INFORMATION; MAGNETOMETERS; MATERIALS; MEASURING INSTRUMENTS; METALS; MICROSCOPY; MICROSTRUCTURE; MICROWAVE EQUIPMENT; MICROWAVE TUBES; NANOMATERIALS; NONMETALS; NUMERICAL DATA; ORIENTATION; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SCATTERING; SILICON COMPOUNDS; SURFACE COATING; THREE-DIMENSIONAL LATTICES; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2018 Springer Science+Business Media, LLC, part of Springer Nature
- Notes
- http://www.springer-ny.com