Published June 1986 | Version v1
Journal article

Photoelectron study of the 4d subshell of atomic tin between 35 and 115eV

  • 1. Oak Ridge National Lab., TN (USA)

Description

Partial cross sections sigma and angular distribution parameters β have been measured for the 4d electrons of atomic tin between 35 and 115 eV. Our data for tin (Z=50) are compared with relativistic-random phase approximation (RRPA) calculations on the closed-shell atom cadmium (Z=48). Satisfactory agreement is found if the results are normalized to the same photoelectron energy. Comparison with RRPA calculations made for palladium (Z=46) and xenon (Z=54) reveals some differences. Other experimental data for the β parameter are in good agreement with our values. (orig.)

Additional details

Publishing Information

Journal Title
Z. Phys., D
Journal Volume
2
Journal Issue
2
Series
Z. Phys., D.
Journal Page Range
123-126
ISSN
0178-7683
CODEN
ZDACE

Optional Information

Contract/Grant/Project number
Contract DE-AC05-840R21400; Grant DMR-84-21292