Published June 24, 2009 | Version v1
Journal article

Enhancement of hole-injection and power efficiency of organic light emitting devices using an ultra-thin ZnO buffer layer

  • 1. Department of Electrical Engineering, National Cheng Kung University, Tainan, 701-01, Taiwan (China)
  • 2. Center for Micro/Nano Science and Technology, National Cheng Kung University, Tainan, 701, Taiwan (China)
  • 3. Institute of Nanotechnology and Microsystems Engineering, National Cheng Kung University, Tainan, 701, Taiwan (China)
  • 4. Department of Applied Physics, National Chiayi University, Chiayi, 600-83, Taiwan (China)

Description

The advantages of using an anode buffer layer of ZnO on the electro-optical properties of organic light emitting devices (OLEDs) are reported. ZnO powders were thermal-evaporated and then treated with ultra-violet (UV) ozone exposure to make the ZnO layers. The turn-on voltage of OLEDs decreased from 4 V (4.2 cd/m2) to 3 V (3.4 cd/m2) and the power efficiency increased from 2.7 lm/W to 4.7 lm/W when a 1-nm-thick ZnO layer was inserted between indium tin oxide (ITO) anodes and α-naphthylphenylbiphenyl diamine (NPB) hole-transporting layers. X-ray and ultra-violet photoelectron spectroscopy (XPS and UPS) results revealed the formation of the ZnO layer and showed that the work function increased by 0.59 eV when the ZnO/ITO layer was treated by UV-ozone for 20 min. The surface of the ZnO/ITO film became smoother than that of bare ITO film after the UV-ozone treatment. Thus, the hole-injection energy barrier was lowered by inserting an ZnO buffer layer, resulting in a decrease of the turn-on voltage and an increase of the power efficiency of OLEDs.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.jallcom.2008.12.122

Additional details

Identifiers

DOI
10.1016/j.jallcom.2008.12.122;
PII
S0925-8388(09)00004-8;

Publishing Information

Journal Title
Journal of Alloys and Compounds
Journal Volume
479
Journal Issue
1-2
Journal Page Range
p. 520-524
ISSN
0925-8388
CODEN
JALCEU

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.