Published October 10, 1984 | Version v1
Patent Open

Ion implantation in semiconductor bodies

Description

Ions are selectively implanted into layers of a semiconductor substrate of, for example, semi-insulating gallium arsenide via a photoresist implantation mask and a metallic layer of, for example, titanium disposed between the substrate surface and the photoresist mask. After implantation the mask and metallic layer are removed and the substrate heat treated for annealing purposes. The metallic layer acts as a buffer layer and prevents possible contamination of the substrate surface, by photoresist residues, at the annealing stage. Such contamination would adversely affect the electrical properties of the substrate surface, particularly gallium arsenide substrates. (author)

Availability note (English)

MF available from INIS under the Report Number.

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Additional details

Publishing Information

Imprint Pagination
3 p.
IPC:
Int. Cl. H01l21/245.
IPC
Int. Cl. H01l21/245.
Patent number
GB patent document 2137806/A/

Optional Information

Secondary number(s)
GB patent application 8309125.