Published October 10, 1984
| Version v1
Patent
Open
Ion implantation in semiconductor bodies
Description
Ions are selectively implanted into layers of a semiconductor substrate of, for example, semi-insulating gallium arsenide via a photoresist implantation mask and a metallic layer of, for example, titanium disposed between the substrate surface and the photoresist mask. After implantation the mask and metallic layer are removed and the substrate heat treated for annealing purposes. The metallic layer acts as a buffer layer and prevents possible contamination of the substrate surface, by photoresist residues, at the annealing stage. Such contamination would adversely affect the electrical properties of the substrate surface, particularly gallium arsenide substrates. (author)
Availability note (English)
MF available from INIS under the Report Number.Files
16032235.pdf
Files
(153.5 kB)
| Name | Size | Download all |
|---|---|---|
|
md5:9e49265cbabd5adb8043be33a2b0db0d
|
153.5 kB | Preview Download |
Additional details
Publishing Information
- Imprint Pagination
- 3 p.
- IPC:
- Int. Cl. H01l21/245.
- IPC
- Int. Cl. H01l21/245.
- Patent number
- GB patent document 2137806/A/
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- United Kingdom
- INIS RN
- 16032235
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ANNEALING; ELECTRICAL PROPERTIES; GALLIUM ARSENIDES; ION IMPLANTATION; LAYERS; SEMICONDUCTOR MATERIALS; SPECIFICATIONS; TITANIUM
- Descriptors DEC
- ARSENIC COMPOUNDS; ARSENIDES; ELEMENTS; GALLIUM COMPOUNDS; HEAT TREATMENTS; MATERIALS; METALS; PHYSICAL PROPERTIES; TRANSITION ELEMENTS
Optional Information
- Secondary number(s)
- GB patent application 8309125.