Published December 1, 2006
| Version v1
Journal article
Experience with bipolar front-end amplifiers and perspectives for LHC upgrade
Creators
- 1. CERN, European Organization for Nuclear Research, Geneva (Switzerland)
- 2. Faculty Physics and Applied Computer Science, AGH University Science Technology, Cracow (Poland)
Description
The paper presents detailed noise analysis of detector front-end circuits employing bipolar transistors. The noise models of bipolar transistors are reviewed. Noise analysis of the front-end circuit is performed taking into account noise correlation effects in bipolar transistors. The obtained results on the equivalent noise charge are compared with the measurements performed for the front-end circuit used in the SCTA ASIC. The elaborated formalism of noise analysis is used for the evaluation of noise performance of a front-end circuit employing SiGe heterojunction bipolar transistors
Additional details
Identifiers
- DOI
- 10.1016/j.nima.2006.09.008;
- PII
- S0168-9002(06)01580-4;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 568
- Journal Issue
- 2
- Journal Page Range
- p. 877-888
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38038096
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- AMPLIFIERS; CERN LHC; DAMAGE; GERMANIUM SILICIDES; HETEROJUNCTIONS; INTEGRATED CIRCUITS; NOISE; PERFORMANCE; RADIATION DETECTORS; SILICON; TRANSISTORS
- Descriptors DEC
- ACCELERATORS; CYCLIC ACCELERATORS; ELECTRONIC CIRCUITS; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; GERMANIUM COMPOUNDS; MEASURING INSTRUMENTS; MICROELECTRONIC CIRCUITS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR JUNCTIONS; SEMIMETALS; SILICIDES; SILICON COMPOUNDS; STORAGE RINGS; SYNCHROTRONS
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.