Abnormal n-type doping effect in nitrogen-doped tungsten diselenide prepared by moderate ammonia plasma treatment
- 1. Fudan University, State Key Laboratory of Molecular Engineering of Polymers, Department of Macromolecular Science (China)
Description
To facilitate potential applications of tungsten diselenide (WSe2) in electronics, controllable doping is of great importance. As an industrially compatible technology, plasma treatment has been used to dope two-dimensional (2D) materials. However, owing to the strong etching effect in transition metal dichalcogenides (TMDCs), it is difficult to controllably dope 2D WSe2 crystals by plasma. Herein, we develop a moderate ammonia plasma treatment method to prepare nitrogen-doped WSe2 with controlled nitrogen content. Interestingly, Raman, photoluminescence, X-ray photoelectron spectroscopy, and electrical measurements reveal abnormal n-doping behavior of nitrogen-doped WSe2, which is attributed to selenium anion vacancy introduced by hydrogen species in ammonia plasma. Nitrogen-doped WSe2 with abnormal n-doping behavior has potential applications in future TMDCs-based electronics. .
Additional details
Identifiers
Publishing Information
- Journal Title
- Nano Research (Print)
- Journal Volume
- 11
- Journal Issue
- 9
- Journal Page Range
- p. 4923-4930
- ISSN
- 1998-0124
INIS
- Country of Publication
- China
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 51019918
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- AMMONIA; ANIONS; CRYSTALS; DOPED MATERIALS; ETCHING; HYDROGEN; NITROGEN; N-TYPE CONDUCTORS; PHOTOLUMINESCENCE; PLASMA; RAMAN SPECTROSCOPY; SELENIUM IONS; TUNGSTEN SELENIDES; VACANCIES; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CHALCOGENIDES; CHARGED PARTICLES; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELECTRON SPECTROSCOPY; ELEMENTS; EMISSION; HYDRIDES; HYDROGEN COMPOUNDS; IONS; LASER SPECTROSCOPY; LUMINESCENCE; MATERIALS; NITROGEN COMPOUNDS; NITROGEN HYDRIDES; NONMETALS; PHOTOELECTRON SPECTROSCOPY; PHOTON EMISSION; POINT DEFECTS; REFRACTORY METAL COMPOUNDS; SELENIDES; SELENIUM COMPOUNDS; SEMICONDUCTOR MATERIALS; SPECTROSCOPY; SURFACE FINISHING; TRANSITION ELEMENT COMPOUNDS; TUNGSTEN COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2018 Tsinghua University Press and Springer-Verlag GmbH Germany, part of Springer Nature