Published January 1, 1991 | Version v1
Journal article Metadata-only

Noise measurement of YBa2Cu3O7-x and Ti2Ba2Ca2Cu3O10-x thin films

Creators

  • 1. Department of Electrical and Computer Engineering, State University of New York at Buffalo, Bonner Hall, Amherst, New York 14260 (USA)
  • 2. Behlen Laboratory of Physics and Center for Materials Research and Analysis, University of Nebraska-Lincoln, Lincoln, Nebraska (USA)

Description

The noise of YBa2Cu3O7-x and Tl2Ba2Cr2Cu3O10-x thin films in the frequency range from 0.5 Hz to 100 kHz was studied. In the normal state, it was found that 1/f noise dominated, with a magnitude strongly dependent on temperature. In the superconducting state, the noise was only observable at frequencies below 5 Hz with our present setup. Equilibrium thermal fluctuation noise was not observed in these films

Additional details

Publishing Information

Journal Title
Journal of Applied Physics
Journal Volume
69
Journal Issue
1
Series
J. Appl. Phys.
Journal Page Range
553-555
ISSN
0021-8979
CODEN
JAPIA

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
22042595
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
BARIUM OXIDES; CHROMIUM OXIDES; COPPER OXIDES; FREQUENCY DEPENDENCE; HIGH-TC SUPERCONDUCTORS; HZ RANGE; KHZ RANGE 01-100; NOISE; SUPERCONDUCTING FILMS; THALLIUM OXIDES; YTTRIUM OXIDES
Descriptors DEC
ALKALINE EARTH METAL COMPOUNDS; BARIUM COMPOUNDS; CHALCOGENIDES; CHROMIUM COMPOUNDS; COPPER COMPOUNDS; FILMS; FREQUENCY RANGE; KHZ RANGE; OXIDES; OXYGEN COMPOUNDS; SUPERCONDUCTORS; THALLIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; YTTRIUM COMPOUNDS