Published January 1997 | Version v1
Journal article

Beam position monitor engineering

Creators

  • 1. Stanford Linear Accelerator Center, Stanford, California 94309 (United States)

Description

The design of beam position monitors often involves challenging system design choices. Position transducers must be robust, accurate, and generate adequate position signal without unduly disturbing the beam. Electronics must be reliable and affordable, usually while meeting tough requirements on precision, accuracy, and dynamic range. These requirements may be difficult to achieve simultaneously, leading the designer into interesting opportunities for optimization or compromise. Some useful techniques and tools are shown. Both finite element analysis and analytic techniques will be used to investigate quasi-static aspects of electromagnetic fields such as the impedance of and the coupling of beam to striplines or buttons. Finite-element tools will be used to understand dynamic aspects of the electromagnetic fields of beams, such as wake fields and transmission-line and cavity effects in vacuum-to-air feedthroughs. Mathematical modeling of electrical signals through a processing chain will be demonstrated, in particular to illuminate areas where neither a pure time-domain nor a pure frequency-domain analysis is obviously advantageous. Emphasis will be on calculational techniques, in particular on using both time domain and frequency domain approaches to the applicable parts of interesting problems. copyright 1997 American Institute of Physics

Additional details

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
390
Journal Issue
1
Journal Page Range
p. 50-65.
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
7. workshop on beam instrumentation.
Dates
6-9 May 1996.
Place
Argonne, IL (United States).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
28075208
Subject category
S43: PARTICLE ACCELERATORS; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BEAM MONITORING; BEAM MONITORS; BEAM POSITION; DESIGN; ELECTROMAGNETIC FIELDS; FINITE ELEMENT METHOD; SIGNAL CONDITIONING
Descriptors DEC
CALCULATION METHODS; MEASURING INSTRUMENTS; MONITORING; MONITORS; NUMERICAL SOLUTION

Optional Information

Secondary number(s)
CONF-9605173--.