Published September 1, 2020 | Version v1
Journal article

Step height standards based on self-assembly for 3D metrology of biological samples

  • 1. VTT MIKES, Tekniikantie 1, 02150 Espoo (Finland)
  • 2. University of Helsinki, Fabianinkatu 33, 00014 Helsinki (Finland)
  • 3. Sensofar Tech SL, Parc Audiovisual de Catalunya Ctra BV-1274 Km 1, 08225 Terrassa, Barcelona (Spain)

Description

Modern microscopes and profilometers such as the coherence scanning interferometer (CSI) approach sub-nm precision in height measurements. Transfer standards at all measured size scales are needed to guarantee traceability at any scale and utilize the full potential of these instruments, but transfer standards with similar characteristics upon reflection to those of the measured samples are preferred. This is currently not the case for samples featuring dimensions of less than 10 nm and for biosamples with different optical charasteristics to silicon, silica or metals. To address the need for 3D images of biosamples with traceable dimensions, we introduce a transfer standard with dimensions guaranteed by natural self-assembly and a material that is optically similar to that in typical biosamples. We test the functionality of these transfer standards by first calibrating them using an atomic force microscope (AFM) and then using them to calibrate a CSI. We investigate whether a good enough calibration accuracy can be reached to enable a useful calibration of the CSI system. The result is that the calibration uncertainty is only marginally increased due to the sample. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1361-6501/ab8c6a

Additional details

Identifiers

Publishing Information

Journal Title
Measurement Science and Technology
Journal Volume
31
Journal Issue
9
Journal Page Range
[5 p.]
ISSN
0957-0233
CODEN
MSTCEP

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
52117713
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
ACCURACY; ATOMIC FORCE MICROSCOPY; CALIBRATION; INTERFEROMETERS; METROLOGY; MICROSCOPES; REFLECTION; SILICA; SILICON; STANDARDS
Descriptors DEC
ELEMENTS; MEASURING INSTRUMENTS; MICROSCOPY; MINERALS; OXIDE MINERALS; SEMIMETALS