Published September 1987
| Version v1
Journal article
Elemental analysis using electron beam-induced K X-rays
Creators
- 1. Strasbourg-1 Univ., 67 (France)
- 2. Koeln Univ. (Germany, F.R.). Inst. fuer Kernphysik
Description
Representative production cross-sections for bremsstrahlung, which constitutes an unavoidable spectral background in an x-ray analysis using electron beam excitation, have been calculated as a function of target and angle for incident electrons in the energy range 0.2-10 MeV. These values, used in conjunction with the corresponding K x-ray production cross-sections and non-fundamental experimental variables particular to each laboratory (detector resolution and ambient background), determine the feasibility of a K x-ray analysis by direct electron beam excitation, and permit the evaluation of an ideal detection limit. (author)
Additional details
Publishing Information
- Journal Title
- X-Ray Spectrom., XRS
- Journal Volume
- 16
- Journal Issue
- 5
- Series
- X-Ray Spectrom., XRS.
- Journal Page Range
- 207-209
- ISSN
- 0049-8246
- CODEN
- XRSPA
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- United Kingdom
- INIS RN
- 19007585
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- BREMSSTRAHLUNG; CROSS SECTIONS; ELECTRON BEAMS; INCIDENCE ANGLE; K SHELL; KEV RANGE 100-1000; MEV RANGE 01-10; QUALITATIVE CHEMICAL ANALYSIS; SENSITIVITY; X RADIATION
- Descriptors DEC
- BEAMS; CHEMICAL ANALYSIS; ELECTROMAGNETIC RADIATION; ELECTRONIC STRUCTURE; ENERGY RANGE; IONIZING RADIATIONS; KEV RANGE; LEPTON BEAMS; MEV RANGE; PARTICLE BEAMS; RADIATIONS