Published 1985
| Version v1
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Beam potential measurement of an intense H- beam by use of the emissive probe technique
Description
An emissive probe has been developed to study the beam-plasma potential generated by a 20-keV, 30-mA/cm2 quiescent H- beam propagating in Xe background gas. An axial ion trap has been built, and its influence on the measured potentials is reported. The peak plasma potential at 1012 cm-3 Xe density increased from +5V to +10V when the ion-trap voltage was increased from zero to +80V. The quiescent H- beam rms emittance, measured 34 cm from the ion source, increased from 0.012 to 0.023 π x cm x mrad when the Xe density was decreased from 2.2 x 1012 cm-3 to zero. 8 refs., 3 figs
Availability note (English)
MF available from INIS under the Report Number; Available from NTIS, PC A02/MF A01 as DE85012671.
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Restricted
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Additional details
Publishing Information
- Imprint Pagination
- 4 p.
- Report number
- LA-UR--85-1606
Conference
- Title
- Particle accelerator conference.
- Dates
- 13-16 May 1985.
- Place
- Vancouver (Canada).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 17000317
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BEAM EMITTANCE; BEAM MONITORING; BEAM TRANSPORT; BEAM-PLASMA SYSTEMS; HYDROGEN 1 MINUS BEAMS; KEV RANGE 10-100; XENON
- Descriptors DEC
- BEAMS; ELEMENTS; ENERGY RANGE; ION BEAMS; KEV RANGE; MONITORING; NONMETALS; RARE GASES
Optional Information
- Secondary number(s)
- CONF-850504--65.