Published July 1, 2005 | Version v1
Journal article

CMOS active pixel sensors for ionising radiation

  • 1. University of Liverpool (United Kingdom) and MRC Laboratory of Molecular Biology (United Kingdom)
  • 2. University of Liverpool (United Kingdom)
  • 3. MRC Laboratory of Molecular Biology (United Kingdom)
  • 4. Rutherford Appleton Laboratory (United Kingdom)
  • 5. University of Birmingham (United Kingdom)

Description

Monolithic Active Pixel Sensors (MAPS) take advantage of recent developments in deep sub-micron VLSI technology. CMOS sensors now enjoy widespread commercial applications as inexpensive visible light-imaging devices. These are also being utilised and developed for an increasing number of scientific fields due to advantages which include: low power consumption, radiation hardness, small pixel size and on-chip or even in-pixel processing capabilities. We have designed, characterised and evaluated a number of prototype CMOS MAPS devices as position-sensitive detectors for ionising radiation. This development was primarily driven by the requirements of the Linear Collider vertex detector but a broader spectrum of applications, including several outside particle physics, has been explored and some of these are also briefly presented here

Additional details

Identifiers

DOI
10.1016/j.nima.2005.03.108;
PII
S0168-9002(05)00613-3;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
546
Journal Issue
1-2
Journal Page Range
p. 281-285
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
6. international workshop on radiation imaging detectors
Dates
25-29 Jul 2004
Place
Glasgow (United Kingdom)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37040057
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ELECTRON MICROSCOPY; EQUIPMENT; LINEAR COLLIDERS; POSITION SENSITIVE DETECTORS; RADIATION HARDENING; SEMICONDUCTOR DETECTORS; VISIBLE RADIATION
Descriptors DEC
ACCELERATORS; ELECTROMAGNETIC RADIATION; HARDENING; LINEAR ACCELERATORS; MEASURING INSTRUMENTS; MICROSCOPY; PHYSICAL RADIATION EFFECTS; RADIATION DETECTORS; RADIATION EFFECTS; RADIATIONS

Optional Information

Copyright
Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.