Information stored in high-Q space: Role of high energy scattering
- 1. Department of Materials Science and Engineering, University of Pennsylvania, Philadelphia, Pennsylvania19104-6272 (United States)
- 2. Department of Physics and Astronomy and Center for Fundamental Materials Research, Michigan State University, East Lansing, Michigan48824-1116 (United States)
- 3. CHESS, Cornell University, Ithaca, New York14853 (United States)
- 4. Los Alamos National Laboratory, Los Alamos, New Mexico87545 (United States)
Description
Much of crystallographic diffraction measurements are focused on obtaining information with Q(=4πsinθ/λ) below 17 Angstrom -1 or d>0.35 Angstrom, with the implicit assumption that no useful information is stored in the Q space above. However, this assumption is valid only with respect to the periodic lattice structure. Actually, high-Q space is full of information on the local atomic structure that could be of major importance in some cases. We discuss high energy x-ray or neutron scattering as the methods of obtaining the data from the high-Q space, and the atomic pair-distribution function (PDF) analysis as the means of extracting information from such data. Preliminary data of our recent high-energy x-ray scattering measurement on a MX compound are shown for which this type of analysis is likely to play a significant role in understanding the properties. copyright 1997 American Institute of Physics
Additional details
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 417
- Journal Issue
- 1
- Journal Page Range
- p. 209-213
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 10. U.S. national conference on synchrotron radiation instrumentation
- Acronym
- SRI '97
- Dates
- 17-20 Jun 1997
- Place
- Ithaca, NY (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 30057310
- Subject category
- S07: ISOTOPES AND RADIATION SOURCES; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COMPARATIVE EVALUATIONS; CRYSTAL STRUCTURE; PERFORMANCE; SPATIAL RESOLUTION; SYNCHROTRON RADIATION SOURCES; X RADIATION; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; EVALUATION; IONIZING RADIATIONS; RADIATION SOURCES; RADIATIONS; RESOLUTION; SCATTERING
Optional Information
- Secondary number(s)
- CONF-9706157--