Source apportionment of aerosol particles using polycapillary slightly focusing X-ray lens
Creators
- 1. Key Laboratory of Beam Technology and Materials Modification of Ministry of Education, Beijing Normal University, Beijing 100875 (China) and Institute of Low Energy Nuclear Physics, Beijing Normal University, Beijing 100875 (China) and Beijing Radiation Center, Beijing 100875 (China)
- 2. Beijing Radiation Center, Beijing 100875 (China)
- 3. Institute of Low Energy Nuclear Physics, Beijing Normal University, Beijing 100875 (China)
- 4. Key Laboratory of Beam Technology and Materials Modification of Ministry of Education, Beijing Normal University, Beijing 100875 (China)
- 5. Center for Disease Control and Prevention of Beijing, Beijing 100013 (China)
- 6. Institute of High Energy Physics, Chinese Academy of Science, Beijing 100039 (China)
Description
A micro-X-ray fluorescence (Micro-XRF) spectrometer based on a polycapillary slightly focusing X-ray lens (PSFXRL) and laboratory X-ray source was designed to carry out the source apportionment of aerosol particles. In the distribution curve of the X-ray intensity in the focal spot of PSFXRL, there was a plateau with a diameter of about 65 μm. The uniformity of this plateau was about 3%. This was helpful in measuring the XRF spectrum of a single aerosol particle in which the element distributions are not uniform. The minimum detection limit (MDL) of this Micro-XRF spectrometer was 15 ppm for the Fe-Kα. The origins of the aerosol particles at the exit of a subway station and a construction site were apportioned. This Micro-XRF spectrometer has potential applications in analysis of single aerosol particles.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2009.01.009Additional details
Identifiers
- DOI
- 10.1016/j.nima.2009.01.009;
- PII
- S0168-9002(09)00024-2;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 604
- Journal Issue
- 3
- Journal Page Range
- p. 755-759
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41034969
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- AEROSOLS; DISTRIBUTION; FLUORESCENCE; FOCUSING; OPTICS; ORIGIN; PARTICLES; SENSITIVITY; SPECTRA; SPECTROMETERS; X RADIATION; X-RAY FLUORESCENCE ANALYSIS; X-RAY SOURCES
- Descriptors DEC
- CHEMICAL ANALYSIS; COLLOIDS; DISPERSIONS; ELECTROMAGNETIC RADIATION; EMISSION; IONIZING RADIATIONS; LUMINESCENCE; MEASURING INSTRUMENTS; NONDESTRUCTIVE ANALYSIS; PHOTON EMISSION; RADIATION SOURCES; RADIATIONS; SOLS; X-RAY EMISSION ANALYSIS
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.