Published 2021
| Version v1
Report
The HVE low-energy multi-element AMS system with charge state selector in its high voltage terminal
Creators
- 1. High Voltage Engineering Europa B.V., Amersfoort (Netherlands)
Description
High Voltage Engineering Europa B.V. (HVE) has designed a 300 kV AMS system for the measurement of 14C and of non-radiocarbon isotope species like 3H, 10Be, 26Al, 41Ca, 129I and actinides. The system features an electrostatic analyzer (ESA) as well as a high resolution analyzing magnet in the low-energy spectrometer, a 300 kV, vacuum insulated tandem accelerator and a high energy (HE) spectrometer comprising two high resolution magnets and an ESA in between. The layout of the system is shown. Located after the terminal stripper is an electrostatic deflector acting as charge state selector (CSS). The CSS fundamentally reduces a specific class of measurement background, especially beneficial for actinides.
Additional details
Identifiers
Publishing Information
- Imprint Title
- Technical Meeting on Developments in Non-Radiocarbon Accelerator Mass Spectrometry Techniques and Relevant Applications. Booklet of Abstracts
- Imprint Pagination
- 42 p.
- Journal Page Range
- p. 33-34
- Report number
- INIS-XA--22M1824
Conference
- Title
- Technical Meeting on Developments in Non-Radiocarbon Accelerator Mass Spectrometry Techniques and Relevant Applications (Virtual Event)
- Dates
- 11-14 Oct 2021
- Place
- Vienna (Austria)
INIS
- Country of Publication
- International Atomic Energy Agency (IAEA)
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 53080061
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CHARGE STATES; DESIGN; ELECTRIC POTENTIAL; ELECTROSTATIC ANALYZERS; ELECTROSTATICS; MAGNETS; RESOLUTION; SPECTROMETERS; TANDEM ELECTROSTATIC ACCELERATORS
- Descriptors DEC
- ACCELERATORS; BEAM ANALYZERS; ELECTROSTATIC ACCELERATORS; EQUIPMENT; MEASURING INSTRUMENTS
Optional Information
- Notes
- 3 refs., 1 fig.