SEU error rates in advanced digital CMOS

Space-based electronics is exposed to cosmic radiations that result in bit reversal errors or Single Event Upsets. Those errors are generally taken into account through an error-rate quantification expressed in Expected errors per Bit-Day (EBD). A procedure to evaluate this EBD for CMOS memory devices is presented here and applied to a typical data set. This method arises from a development of the upset rate convolution integral. It can be applied to ground-based test data, and provide a realistic upset-rate estimate for space flight conditions. (D.L.). 20 refs., 7 figs