Published February 2004
| Version v1
Journal article
Research and development of low energy X-ray precision diffraction technology
- 1. National Inst. of Materials Science, Tsukuba, Ibaraki (Japan)
Description
The research concerns new wavelength markers. It is necessary to know X-ray wavelength precisely for X ray analysis application. Uncertainty evaluation of wavelength for Fe 14.4 kev nuclear resonance scattering was continued. Absolute measurements were prepared of nuclear resonance scattering wavelength near 8 kev of Kr and Tm to determine wavelength markers in low energy region. Goniometer was modified for improvement of stabilities on mechanical vibration and temperature change. Absolute measurement of silicon lattice parameters was conducted for enhancement of precision for standard crystals. (H. Yokoo)
Additional details
Publishing Information
- Journal Title
- Kokuritsu Kikan Genshiryoku Shiken Kenkyu Seika Hokoku-Sho
- Journal Issue
- no.43
- Journal Page Range
- p. 33.1-33.3
- ISSN
- 0288-8874
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 36047191
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ACCURACY; CRYSTAL LATTICES; GONIOMETERS; KEV RANGE 01-10; KEV RANGE 10-100; LATTICE PARAMETERS; SYNCHROTRON RADIATION; WAVELENGTHS; X-RAY DIFFRACTION; X-RAY DIFFRACTOMETERS; X-RAY EMISSION ANALYSIS; X-RAY SPECTROSCOPY
- Descriptors DEC
- BREMSSTRAHLUNG; CHEMICAL ANALYSIS; COHERENT SCATTERING; CRYSTAL STRUCTURE; DIFFRACTION; DIFFRACTOMETERS; ELECTROMAGNETIC RADIATION; ENERGY RANGE; KEV RANGE; MEASURING INSTRUMENTS; NONDESTRUCTIVE ANALYSIS; RADIATIONS; SCATTERING; SPECTROSCOPY