Azimuthal anisotropy of the scattered radiation in grazing incidence X-ray fluorescence
- 1. Indus Synchrotrons Utilisation Division, Raja Ramanna Centre for Advanced Technology, Indore-452013 (India)
Description
The Compton and elastic scattering radiations are the major contributor to the spectral background of an x-ray fluorescence spectrum, which eventually limits the element detection sensitivities of the technique to µg/g (ppm) range. In the present work, we provide a detail mathematical descriptions and show that how polarization properties of the synchrotron radiation influence the spectral background in the x-ray fluorescence technique. We demonstrate our theoretical understandings through experimental observations using total x-ray fluorescence measurements on standard reference materials. Interestingly, the azimuthal anisotropy of the scattered radiation is shown to have a vital role on the significance of the x-ray fluorescence detection sensitivities
Additional details
Identifiers
- DOI
- 10.1063/1.4917943;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 1665
- Journal Issue
- 1
- Journal Page Range
- vp.
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 59. DAE solid state physics symposium 2014
- Dates
- 16-20 Dec 2014
- Place
- Tamilnadu (India)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47060478
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANISOTROPY; ELASTIC SCATTERING; FLUORESCENCE; FLUORESCENCE SPECTROSCOPY; MULTI-ELEMENT ANALYSIS; POLARIZATION; SENSITIVITY; SYNCHROTRON RADIATION; X RADIATION; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- BREMSSTRAHLUNG; CHEMICAL ANALYSIS; ELECTROMAGNETIC RADIATION; EMISSION; EMISSION SPECTROSCOPY; IONIZING RADIATIONS; LUMINESCENCE; NONDESTRUCTIVE ANALYSIS; PHOTON EMISSION; RADIATIONS; SCATTERING; SPECTROSCOPY; X-RAY EMISSION ANALYSIS
Optional Information
- Notes
- (c) 2015 AIP Publishing LLC