Published May 15, 1988 | Version v1
Patent Open

Charged particle mass separation technique

Description

A quadrupole mass-spectrometer intended for secondary ion mass-spectrometry is described. The invention is aimed at increasing the quadrupole mass-spectrometer resolution. This is achieved by combined application of the first and the second regions of charged particle trajectory stability in two sequentially located quadrupole capacitors. In this case the values of Mateux equation q1 and q2 parameters for the both capacitors with respectively the first and the second stability regions are selected from 8.773<q2/q1<10.643 term. 5 figs

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Additional details

Additional titles

Original title (Russian)
Способ масс-сепарации заряженных частиц

Publishing Information

Imprint Pagination
10 p.
IPC:
Int. Cl. H 01 J 49/42.
IPC
Int. Cl. H 01 J 49/42.
Patent number
SU patent document 1396174/A1/

Optional Information