Retrospective dosimetry using TL/OSL method
- 1. Centre for Energy Research, Hungarian Academy of Science, Budapest (Hungary)
Description
The increasing risk of violent terror attacks concerning radioactive or nuclear materials require preparatory investigations. Environmental disasters and unexpected events prove also the requirement of different analytical methods which are able to moderate the impact on human race. After these events suitable dose estimation is required within the less time possible. Several methods and processes have been developed in the last few years for retrospective determination or estimation of dose conditions in the affected area. Electronic devices such as SMD resistors have been investigated and results show that suitable sensitivity and dose response verify the use of the method. This paper discusses further and detailed investigations of luminescence properties of SMD resistors and the usage of them in real emergency. (author)
Availability note (English)
Available from http://dx.doi.org/10.15669/pnst.4.692Additional details
Identifiers
- DOI
- 10.15669/pnst.4.692;
Publishing Information
- Journal Title
- Progress in Nuclear Science and Technology
- Journal Volume
- 4
- Journal Page Range
- p. 692-694
- ISSN
- 2185-4823
Conference
- Title
- 12. international conference on radiation shielding; RPSD-2012: 17. topical meeting of the Radiation Protection and Shielding Division of ANS
- Acronym
- ICRS-12
- Dates
- 2-7 Sep 2012
- Place
- Nara (Japan)
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 49053031
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALUMINIUM OXIDES; ANNEALING; CERAMICS; DOSE-RESPONSE RELATIONSHIPS; GLOW CURVE; PHOTOLUMINESCENCE; RADIATION DOSES; RESISTORS; SILICON OXIDES; THERMOLUMINESCENCE; THERMOLUMINESCENT DOSIMETRY
- Descriptors DEC
- ALUMINIUM COMPOUNDS; CHALCOGENIDES; DOSES; DOSIMETRY; ELECTRICAL EQUIPMENT; EMISSION; EQUIPMENT; HEAT TREATMENTS; LUMINESCENCE; OXIDES; OXYGEN COMPOUNDS; PHOTON EMISSION; SILICON COMPOUNDS
Optional Information
- Notes
- 6 refs., 5 figs.