Important aspects for the mass production of GaN-based quantum devices grown by MOCVD
- 1. AIXTRON AG, Kackertstr. 15-17, D-52072 Aachen (Germany)
Description
The requirements for mass production of electronic and optoelectronic devices call for the expansion of MOCVD reactor capacity by increasing the number of wafers and the wafer size. Today, MOCVD reactors with capacities of 24 x 2 in. and 8 x 4 in. are readily available. Growth experiments on 4-in. wafers, however, require careful process and reactor hardware design since the effects related to strain and the resultant wafer bow are more pronounced in larger wafers. We have investigated the design criteria for MOCVD hardware and developed a tool for the straightforward optimization of the hardware to a given device structure and process. Morphological and electrical studies show that samples with off-cuts of 0.3o and 0.4o from the c-plane offer the broadest temperature process window for the growth of GaN
Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2006.07.101;
- PII
- S0040-6090(06)00918-7;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 515
- Journal Issue
- 10
- Journal Page Range
- p. 4362-4364
- ISSN
- 0040-6090
- CODEN
- THSFAP
Conference
- Title
- 3. International conference on materials for advanced technologies: Symposium J-III-V- Semiconductors for microelectronic and optoelectronic applications
- Acronym
- ICMAT 2004
- Dates
- 3-8 Jul 2005
- Place
- Singapore (Singapore)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39018660
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CAPACITY; CHEMICAL VAPOR DEPOSITION; CRYSTAL GROWTH; GALLIUM NITRIDES; SEMICONDUCTOR MATERIALS; STRAINS
- Descriptors DEC
- CHEMICAL COATING; DEPOSITION; GALLIUM COMPOUNDS; MATERIALS; NITRIDES; NITROGEN COMPOUNDS; PNICTIDES; SURFACE COATING
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.