Published January 28, 2008 | Version v1
Journal article

Optical properties of subwavelength metallic-dielectric multilayers

  • 1. Pohl Institute of Solid State Physics, Tongji University, Shanghai 200092 (China)
  • 2. Institute of Precision Optical Engineering, Tongji University, Shanghai 200092 (China)

Description

We present studies on the optical properties of periodic metallic-dielectric (MD) multilayers and numerical results show that there exists, insensitive to the lattice scaling, a transparent band as long as the layer thickness is in the subwavelength ranging. It illustrates the transparent band is controlled by mechanisms beyond the Bragg scattering: the shorter-wavelength band edge comes from the intensive resonant absorption behavior of the metals, while the longer-wavelength band edge is determined by zero (volume) averaged permittivity εeff=0. Moreover, a Lorentz-Drude model for the permittivity of a ε-negative (ENG) metamaterial is used to show that a transparent band may be obtained in a subwavelength structure consisting of ENG multilayers with total length less than both the center wavelength and the half width of the band

Availability note (English)

Available from http://dx.doi.org/10.1016/j.physleta.2007.07.066

Additional details

Identifiers

DOI
10.1016/j.physleta.2007.07.066;
PII
S0375-9601(07)01104-8;

Publishing Information

Journal Title
Physics Letters. A
Journal Volume
372
Journal Issue
5
Journal Page Range
p. 730-734
ISSN
0375-9601
CODEN
PYLAAG

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
39092692
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ABSORPTION; BRAGG REFLECTION; CRYSTALS; DIELECTRIC MATERIALS; LAYERS; METALS; NUMERICAL ANALYSIS; OPTICAL PROPERTIES; PERIODICITY; PERMITTIVITY; SCALING; SCATTERING; THICKNESS; WAVELENGTHS
Descriptors DEC
DIELECTRIC PROPERTIES; DIMENSIONS; ELECTRICAL PROPERTIES; ELEMENTS; MATERIALS; MATHEMATICS; PHYSICAL PROPERTIES; REFLECTION; SORPTION; VARIATIONS

Optional Information

Copyright
Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.