Optical properties of subwavelength metallic-dielectric multilayers
- 1. Pohl Institute of Solid State Physics, Tongji University, Shanghai 200092 (China)
- 2. Institute of Precision Optical Engineering, Tongji University, Shanghai 200092 (China)
Description
We present studies on the optical properties of periodic metallic-dielectric (MD) multilayers and numerical results show that there exists, insensitive to the lattice scaling, a transparent band as long as the layer thickness is in the subwavelength ranging. It illustrates the transparent band is controlled by mechanisms beyond the Bragg scattering: the shorter-wavelength band edge comes from the intensive resonant absorption behavior of the metals, while the longer-wavelength band edge is determined by zero (volume) averaged permittivity εeff=0. Moreover, a Lorentz-Drude model for the permittivity of a ε-negative (ENG) metamaterial is used to show that a transparent band may be obtained in a subwavelength structure consisting of ENG multilayers with total length less than both the center wavelength and the half width of the band
Availability note (English)
Available from http://dx.doi.org/10.1016/j.physleta.2007.07.066Additional details
Identifiers
- DOI
- 10.1016/j.physleta.2007.07.066;
- PII
- S0375-9601(07)01104-8;
Publishing Information
- Journal Title
- Physics Letters. A
- Journal Volume
- 372
- Journal Issue
- 5
- Journal Page Range
- p. 730-734
- ISSN
- 0375-9601
- CODEN
- PYLAAG
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39092692
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ABSORPTION; BRAGG REFLECTION; CRYSTALS; DIELECTRIC MATERIALS; LAYERS; METALS; NUMERICAL ANALYSIS; OPTICAL PROPERTIES; PERIODICITY; PERMITTIVITY; SCALING; SCATTERING; THICKNESS; WAVELENGTHS
- Descriptors DEC
- DIELECTRIC PROPERTIES; DIMENSIONS; ELECTRICAL PROPERTIES; ELEMENTS; MATERIALS; MATHEMATICS; PHYSICAL PROPERTIES; REFLECTION; SORPTION; VARIATIONS
Optional Information
- Copyright
- Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.