Published 2013 | Version v1
Book Metadata-only

Effect of topological layout of cells in memory chips on multiplicity of failures from individual nuclear particles

Creators

  • 1. OAO EhNPO Spetsializirovannye Ehlektronnye Sistemy, Moscow (Russian Federation)
  • 2. Natsional'nyj Issledovatel'skij Yadernyj Univ. MIFI, Moscow (Russian Federation)

Description

no abstract available

Part of:
Scientific session of NRNU MEPHI-2013. Abstracts. In three volumes. Volume 1. Innovative nuclear technologies. High technologies in medicine

Additional details

Additional titles

Original title (Russian)
Влияние топологического размещения ячеек в микросхемах памяти на кратность сбоев от OYaCh

Publishing Information

Publisher
NIYaU MIFI
Imprint Place
Moscow (Russian Federation)
ISBN
978-5-7262-1786-4
Imprint Title
Scientific session of NRNU MEPHI-2013. Abstracts. In three volumes. Volume 1. Innovative nuclear technologies. High technologies in medicine
Imprint Pagination
300 p.
Journal Page Range
p. 97

Conference

Title
Scientific session of NRNU MEPHI-2013
Original Conference Title
Nauchnaya sessiya NIYaU MIFI-2013
Dates
2013
Place
Moscow (Russian Federation)

INIS

Country of Publication
Russian Federation
Country of Input or Organization
Russian Federation
INIS RN
45109405
Subject category
S42: ENGINEERING;
Resource subtype / Literary indicator
No Abstract, Conference
Descriptors DEI
CHARGED PARTICLES; DISTANCE; FAILURES; MEMORY DEVICES; MICROELECTRONIC CIRCUITS; RELIABILITY
Descriptors DEC
ELECTRONIC CIRCUITS

Optional Information

Notes
Imprint:Nauchnaya sessiya NIYaU MIFI-2013. Annotatsii dokladov. V 3-kh tomakh. Tom 1. Innovatsionnye yadernye tekhnologii. Vysokie tekhnologii v meditsine