Application of surface analysis techniques in materials development

For many materials the composition of the surface determines their suitability for a particular use. It is therefore important to have means for analysing the surface only. Characterization techniques using probing beams of elementary particles such as electrons can be used for this purpose and enable one to analyse the material to the limited depth required. A number of these techniques have been developed but mainly for the greatest applicability. These are Auger-electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS or EXCA), secondary ion mass spectroscopy (SIMS) and ion scattering spectroscopy (ISS)