Published April 1981
| Version v1
Journal article
Temperature dependence of the electric field-gradient in metallic tin: A test case for theory
- 1. Rutgers - the State Univ., New Brunswick, NJ (USA)
- 2. Bell Labs., Murray Hill, NJ (USA)
Description
no abstract available
Additional details
Publishing Information
- Journal Title
- Hyperfine Interact.
- Journal Volume
- 9
- Journal Issue
- 1-4
- Series
- Hyperfine Interact.
- Journal Page Range
- 323-328
- ISSN
- 0304-3843
Conference
- Title
- 5. international conference on hyperfine interactions.
- Dates
- 21 - 25 Jul 1980.
- Place
- Berlin, Germany, F.R.
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 12628151
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference, Numerical Data, No Abstract
- Descriptors DEI
- CRYSTAL FIELD; ELECTRIC FIELDS; EXPERIMENTAL DATA; IMPURITIES; QUADRUPOLES; TEMPERATURE DEPENDENCE; TIN; TIN 113
- Descriptors DEC
- BETA DECAY RADIOISOTOPES; DATA; DAYS LIVING RADIOISOTOPES; ELECTRON CAPTURE RADIOISOTOPES; ELEMENTS; EVEN-ODD NUCLEI; INFORMATION; INTERMEDIATE MASS NUCLEI; ISOMERIC TRANSITION ISOTOPES; ISOTOPES; METALS; MINUTES LIVING RADIOISOTOPES; MULTIPOLES; NUCLEI; NUMERICAL DATA; RADIOISOTOPES; TIN ISOTOPES
Optional Information
- Notes
- Published in summary form only.