Published March 2019
| Version v1
Journal article
Luminescence properties of SiO2:Tb nanocrystals obtained via sol-gel route and its applicability to environmental ionizing radiation dosimetry
- 1. University of São Paulo, Av. Professor Luciano Gualberto, 158, 05508-010 São Paulo, SP (Brazil)
- 2. Federal University of São Paulo, Marine Science Department, R. Dr. Carvalho de Mendonça, 144, 11070-100 Santos, SP (Brazil)
- 3. Federal University of São Paulo, Physics Department, R. Dr. Riedel, 275, 09972-270 Diadema, SP (Brazil)
Description
SiO2 was synthesized by sol-gel method and its luminescence investigated by emission spectroscopy and thermoluminescence (TL) techniques. A study on the influence of Tb on SiO2 was performed and a high increase of about 3000 times in TL intensity was observed. In addition, the presence of 4 bands in the UV (309, 336, 344 and 370 nm) and 6 bands (468, 521, 544, 585, 612 and 631 nm) in the visible region were detected. To verify its viability as an environmental radiation dosimeter, optically stimulated luminescence (OSL) measurements were made by irradiating the crystal with beta radiation, and linear growth was obtained in the region of low radiation doses, with minimum detectable dose of 0.4 mGy.
Additional details
Identifiers
- DOI
- 10.1016/j.jlumin.2018.09.053;
- PII
- S0022231318309177;
Publishing Information
- Journal Title
- Journal of Luminescence
- Journal Volume
- 207
- Journal Page Range
- p. 123-128
- ISSN
- 0022-2313
- CODEN
- JLUMA8
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 55015751
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S61: RADIATION PROTECTION AND DOSIMETRY;
- Descriptors DEI
- DOSEMETERS; DOSIMETRY; EMISSION SPECTROSCOPY; IONIZING RADIATIONS; NANOCRYSTALS; SILICA; SILICON OXIDES; SOL-GEL PROCESS; THERMOLUMINESCENCE
- Descriptors DEC
- CHALCOGENIDES; CRYSTALS; EMISSION; LUMINESCENCE; MEASURING INSTRUMENTS; MINERALS; NANOSTRUCTURES; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; PHOTON EMISSION; RADIATIONS; SILICON COMPOUNDS; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2018 Elsevier B.V. All rights reserved.