Published June 2008
| Version v1
Journal article
Optical decay of OSL signal of Al2O3: C detectors exposed to different light sources
- 1. Instituto de Pesquisas Energeticas e Nucleares, IPEN-CNEN/SP Av. Prof. Lineu Prestes, 2242 - 05508-000 - Sao Paulo, SP (Brazil)
- 2. FUNDACENTRO - Rua Capote Valente, 710 - 05409-002 - Sao Paulo, SP (Brazil)
Description
The optically stimulated luminescence technique has been utilized as an option for personal dosimetry due to a variety of factors, as the availability of commercially personal monitoring systems based on the OSL of Al2O3: C. In this work, the sensitivity of OSL detectors of Al2O3: C, Inlight personal dosimetry system, Landauer, was verified for different light levels. The results show that the percentage fading of OSL detectors exposed to 260 lux and 26,000 lux from fluorescent light varied between 16-24% and 76-91% in the first five minutes, respectively. The data confirmed the very high sensitivity to light of these detectors
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nimb.2008.03.139Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2008.03.139;
- PII
- S0168-583X(08)00414-X;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 266
- Journal Issue
- 12-13
- Journal Page Range
- p. 2915-2917
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 14. international conference on radiation effects in insulators
- Acronym
- REI-14
- Dates
- 28 Aug - 1 Sep 2007
- Place
- Caen (France)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40011875
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALUMINIUM OXIDES; AVAILABILITY; DOSIMETRY; LIGHT SOURCES; LUMINESCENCE; SENSITIVITY; SIGNALS; VISIBLE RADIATION
- Descriptors DEC
- ALUMINIUM COMPOUNDS; CHALCOGENIDES; ELECTROMAGNETIC RADIATION; EMISSION; OXIDES; OXYGEN COMPOUNDS; PHOTON EMISSION; RADIATION SOURCES; RADIATIONS
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.