Published December 1987
| Version v1
Journal article
Ionizing radiation dose distribution produced inside a canonical cavity by direct e-beam excitation
- 1. Harry Diamond Labs., US Army LABCOM, 2800 Powder Mill Road, Adelphi, MD 20783-1197 (USA)
Description
Reliable dosimetry methods have been developed to map relativistic electrons that have been injected into a generic cavity. These measuring techniques are: (1) thermoluminescent dosimeters (TLDs) combined with photodiodes yielding dose rate; (2) TLD telescopes yielding electron angular distributions; and (3) TLD mosaic arrays yielding rough energy spectra. Total dose, dose rate, electron angular distribution and current density measurements have been obtained during electromagnetic excitation of a canonical cavity with diffuse electron beam (e-beam) bombardment. A theoretical interpretation of the dose rate and electron current density measurements is presented
Additional details
Publishing Information
- Journal Title
- IEEE Trans. Nucl. Sci.
- Journal Volume
- NS-34
- Journal Issue
- 6
- Series
- IEEE Trans. Nucl. Sci.
- Journal Page Range
- 1521-1529
- ISSN
- 0018-9499
- CODEN
- IETNA
Conference
- Title
- Annual conference on nuclear and space radiation effects.
- Dates
- 28-31 Jul 1987.
- Place
- Snowmass Village, CO (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 19103023
- Subject category
- S73: NUCLEAR PHYSICS AND RADIATION PHYSICS; S61: RADIATION PROTECTION AND DOSIMETRY; S99: GENERAL AND MISCELLANEOUS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANGULAR DISTRIBUTION; CANONICAL TRANSFORMATIONS; ELECTROMAGNETIC FIELDS; ELECTRON BEAMS; ELECTRON DENSITY; ENERGY SPECTRA; EXCITED STATES; IONIZING RADIATIONS; MEASURING METHODS; PERFORMANCE TESTING; PHOTODIODES; RADIATION DOSES; THERMOLUMINESCENT DOSEMETERS; THERMOLUMINESCENT DOSIMETRY
- Descriptors DEC
- BEAMS; DISTRIBUTION; DOSEMETERS; DOSIMETRY; ENERGY LEVELS; LEPTON BEAMS; LUMINESCENT DOSEMETERS; MEASURING INSTRUMENTS; PARTICLE BEAMS; RADIATIONS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SPECTRA; TESTING; TRANSFORMATIONS
Optional Information
- Secondary number(s)
- CONF-8707112--.