Structural, optical and magnetic properties of Zn1-xCoxO thin films prepared by spray pyrolysis
- 1. Department of Physics, Karadeniz Technical University, 61080 Trabzon (Turkey)
- 2. SoloPower Inc.1635 McCandless Drive Milpitas, CA 95035 (United States)
- 3. Department of Physics, Middle East Technical University, 06531, Ankara (Turkey)
Description
A series of Co-doped ZnO films were fabricated by a spray pyrolysis method. The X-ray diffraction patterns of the films showed that the undoped and Co-doped ZnO films exhibit wurtzite crystal structure. Surface morphology of the films obtained by scanning electron microscopy reveals that pure ZnO film has the hexagonal shaped microrods. The introduction of Co content in the structure did not affect the surface morphology of the films significantly. Magnetic hysteresis loops were observed at room temperature, indicating that ferromagnetism can be realized with Co doping into ZnO. The values of remnant magnetization and coercive field slightly decreased when the concentration of Co was increased beyond 1 at.%. The calculated band gap value of undoped and 1 at.% Co doped samples was found to be around 3.08 eV. The band gap energy increases upon 3 at.% Co concentration followed by a decrease for further increase in Co concentration toward 5 at.%
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2008.03.042Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2008.03.042;
- PII
- S0040-6090(08)00345-3;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 516
- Journal Issue
- 21
- Journal Page Range
- p. 7899-7902
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40006058
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- COBALT; COBALT OXIDES; CRYSTAL STRUCTURE; DOPED MATERIALS; EV RANGE 01-10; FERROMAGNETISM; HYSTERESIS; MAGNETIC PROPERTIES; MAGNETIZATION; MORPHOLOGY; OPTICAL PROPERTIES; PYROLYSIS; SCANNING ELECTRON MICROSCOPY; SURFACES; TEMPERATURE RANGE 0273-0400 K; THIN FILMS; X-RAY DIFFRACTION; ZINC OXIDES
- Descriptors DEC
- CHALCOGENIDES; CHEMICAL REACTIONS; COBALT COMPOUNDS; COHERENT SCATTERING; DECOMPOSITION; DIFFRACTION; ELECTRON MICROSCOPY; ELEMENTS; ENERGY RANGE; EV RANGE; FILMS; MAGNETISM; MATERIALS; METALS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SCATTERING; TEMPERATURE RANGE; THERMOCHEMICAL PROCESSES; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS; ZINC COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.