Published May 2004
| Version v1
Journal article
Investigation of Sr2RuO4-Pt contacts in an applied magnetic field
Description
We investigated the spin-triplet superconductor Sr2RuO4 by means of conductance measurements of normal conductor/superconductor point contacts. We present results that show a linear dependence of the excess current as a function of temperature and applied magnetic fields over a wide range of the phase diagram. Applying a magnetic field larger than the upper critical field Bc2 suppresses completely the features related to superconductivity and a conductance minimum at V=0 occurs which becomes more pronounced with increasing field and persists even above Tc up to several K
Additional details
Identifiers
- DOI
- 10.1016/j.jmmm.2003.11.109;
- PII
- S0304885303010370;
Publishing Information
- Journal Title
- Journal of Magnetism and Magnetic Materials
- Journal Volume
- 272-276
- Journal Issue
- 6
- Journal Page Range
- p. E197-E198
- ISSN
- 0304-8853
- CODEN
- JMMMDC
Conference
- Title
- International conference on magnetism
- Acronym
- ICM 2003
- Dates
- 27 Jul - 1 Aug 2003
- Place
- Rome (Italy)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36044539
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CRITICAL FIELD; CRITICAL TEMPERATURE; ELECTRIC CONTACTS; OXIDES; PHASE DIAGRAMS; RUTHENIUM COMPOUNDS; SPECTROSCOPY; SPIN; STRONTIUM COMPOUNDS; SUPERCONDUCTIVITY; SUPERCONDUCTORS; TEMPERATURE DEPENDENCE; TRIPLETS
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; ANGULAR MOMENTUM; CHALCOGENIDES; DIAGRAMS; ELECTRIC CONDUCTIVITY; ELECTRICAL EQUIPMENT; ELECTRICAL PROPERTIES; EQUIPMENT; INFORMATION; MAGNETIC FIELDS; MULTIPLETS; OXYGEN COMPOUNDS; PARTICLE PROPERTIES; PHYSICAL PROPERTIES; REFRACTORY METAL COMPOUNDS; THERMODYNAMIC PROPERTIES; TRANSITION ELEMENT COMPOUNDS; TRANSITION TEMPERATURE
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.