Published July 21, 2001
| Version v1
Journal article
A photoelectron-photoion coincidence method for the investigation of decay probabilities after innershell photoionization
Description
The photoelectron-photoion method presented is shown to be very successful for the quantitative investigation of decay probabilities after innershell photoionization. Especially for the determination of K-shell fluorescence yields of light elements, where only scarce data exist up to now, this method opens up new ways. For all elements we present a general approach to determine fluorescence yields. As an example the investigation of the 1 s decay of free sodium atoms is presented
Additional details
Identifiers
- PII
- S0168900201007252;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 467-468
- Journal Issue
- 1
- Journal Page Range
- p. 1477-1480
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Germany
- INIS RN
- 34015444
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ATOMS; COINCIDENCE METHODS; DE-EXCITATION; ELECTRON DETECTION; EXCITED STATES; FLUORESCENCE; INNER-SHELL IONIZATION; ION DETECTION; K SHELL; PHOTOIONIZATION; SODIUM
- Descriptors DEC
- ALKALI METALS; CHARGED PARTICLE DETECTION; COUNTING TECHNIQUES; DETECTION; ELECTRONIC STRUCTURE; ELEMENTS; EMISSION; ENERGY LEVELS; ENERGY-LEVEL TRANSITIONS; IONIZATION; LUMINESCENCE; METALS; PHOTON EMISSION; RADIATION DETECTION
Optional Information
- Copyright
- Copyright (c) 2001 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.