Effect of helium ion irradiation on short-time corrosion behavior of two novel high-entropy alloys in simulated PWR primary water
Creators
- 1. School of Materials Science and Engineering, University of Science and Technology of China, Shenyang, 110016 (China)
- 2. Key Laboratory of Nuclear Materials and Safety Assessment, Institute of Metal Research, Chinese Academy of Sciences, Shenyang, 110016 (China)
- 3. Institute of Corrosion Science and Technology, Guangzhou, 510530 (China)
Description
Highlights: • The two HEAs shows double-layer oxide film consisting Ti, V and Nb in simulated PWR primary water. • The inner oxide grows by oxidation of the metal atoms, while the outer oxide grows by the dissolution and redeposition of the metal cations. • Helium ion irradiation can hardly enhance corrosion kinetics of the two HEAs due to the severe lattice distortion in HEAs. The effect of helium ion irradiation on the short-time corrosion behavior of two novel high-entropy alloys (HEAs) was investigated in simulated PWR primary water. The results revealed that a double-layer oxide film consisting of Ti, Nb and V oxides was formed on both HEAs, including outer oxide particles and a protective inner oxide layer with a maximum depth of ∼500 nm. Irradiation up to 10.5 dpa may hardly promote corrosion kinetics since severe lattice distortion and sluggish diffusion in HEAs. The corrosion processes with and without irradiation were discussed in detail.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.corsci.2021.109742Additional details
Identifiers
- DOI
- 10.1016/j.corsci.2021.109742;
- PII
- S0010938X21005084;
Publishing Information
- Journal Title
- Corrosion Science
- Journal Volume
- 191
- Journal Page Range
- vp.
- ISSN
- 0010-938X
- CODEN
- CRRSAA
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 54016788
- Subject category
- S36: MATERIALS SCIENCE; S74: ATOMIC AND MOLECULAR PHYSICS;
- Descriptors DEI
- ALLOYS; ATOMIC DISPLACEMENTS; ATOMS; COMPUTERIZED SIMULATION; CORROSION; DIFFUSION; DISSOLUTION; ENTROPY; HELIUM IONS; IRRADIATION; KINETICS; LAYERS; METALS; OXIDATION; OXIDES; PWR TYPE REACTORS; THIN FILMS
- Descriptors DEC
- CHALCOGENIDES; CHARGED PARTICLES; CHEMICAL REACTIONS; ELEMENTS; ENRICHED URANIUM REACTORS; FILMS; IONS; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; PHYSICAL RADIATION EFFECTS; POWER REACTORS; RADIATION EFFECTS; REACTORS; SIMULATION; THERMAL REACTORS; THERMODYNAMIC PROPERTIES; WATER COOLED REACTORS; WATER MODERATED REACTORS
Optional Information
- Copyright
- Copyright (c) 2021 Elsevier Ltd. All rights reserved.