Published December 1, 2010 | Version v1
Journal article

Dual energy phase contrast x-ray imaging with Talbot-Lau interferometer

  • 1. Centre Suisse d'Electronique et de Microtechnique SA, Photonics Division, CH-8005 Zurich (Switzerland)

Description

In weakly absorbing materials such as polymers and soft tissue, x-ray phase sensitive imaging methods can provide substantially enhanced contrast compared to classical, absorption based radiography. For specific applications, the latter can be applied in a dual energy scheme that helps to identify, discriminate and/or quantify materials. In this paper, we report on a new method that combines the idea of dual energy with x-ray phase contrast imaging and thus provides material sensitivity among poor absorbers. The dual energy modality cannot be applied in common phase contrast imaging schemes because of their demand for limited bandwidth or even monochromatic x-ray sources. Our new interferometric method based on diffraction gratings can overcome this shortcoming and thus simultaneously deliver x-ray phase contrast images for two distinct x-ray energy intervals. It has been shown that high quality images can be obtained with the dual energy phase setup. Energy spectra with 40 kV and 70 kV were applied to obtain low- and high-energy images, respectively. Furthermore, an estimation of the effective energy in the image formation process for absorption and phase contrast was experimentally determined. Examples are shown for which the dual energy phase contrast modality delivers complementary information on material composition when compared with the conventional dual energy scheme.

Additional details

Identifiers

Publishing Information

Journal Title
Journal of Applied Physics
Journal Volume
108
Journal Issue
11
Journal Page Range
p. 114906-114906.6
ISSN
0021-8979
CODEN
JAPIAU

Optional Information

Notes
(c) 2010 American Institute of Physics