Incipient plasticity and deformation mechanisms in single-crystal Mg during spherical nanoindentation
Creators
- 1. Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831 (United States)
- 2. Department of Materials Science and Engineering, The University of Tennessee, Knoxville, TN 37996 (United States)
- 3. School of Engineering, Brown University, Providence, RI 02912 (United States)
Description
Incipient plasticity in Mg single crystals was investigated using the pop-ins generated during spherical nanoindentation on (0 0 0 1), (1 0 −1 2) and (1 0 −1 0) surfaces. Representative deformed regions extracted from underneath indents by means of focused ion beam machining were examined by transmission electron microscopy (TEM) to identify the deformation mechanisms. Anisotropic elastic Hertzian contact theory was used to calculate indentation Schmid factors and the relevant resolved shear stresses at pop-in from the load–displacement curves. The pop-in statistics in conjunction with the TEM analysis showed that the most likely deformation mechanism responsible for pop-in is slip via 〈a〉 dislocations even in the case of indentation along the c-axis
Availability note (English)
Available from http://dx.doi.org/10.1016/j.actamat.2013.01.055Additional details
Identifiers
- DOI
- 10.1016/j.actamat.2013.01.055;
- PII
- S1359-6454(13)00094-3;
Publishing Information
- Journal Title
- Acta Materialia
- Journal Volume
- 61
- Journal Issue
- 8
- Journal Page Range
- p. 2953-2965
- ISSN
- 1359-6454
- CODEN
- ACMAFD
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45038207
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- DEFORMATION; DISLOCATIONS; ION BEAMS; MONOCRYSTALS; PLASTICITY; SLIP; STRESSES; SURFACES; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- BEAMS; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; CRYSTALS; ELECTRON MICROSCOPY; LINE DEFECTS; MECHANICAL PROPERTIES; MICROSCOPY
Optional Information
- Copyright
- Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.