Published May 2013 | Version v1
Journal article

Incipient plasticity and deformation mechanisms in single-crystal Mg during spherical nanoindentation

  • 1. Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831 (United States)
  • 2. Department of Materials Science and Engineering, The University of Tennessee, Knoxville, TN 37996 (United States)
  • 3. School of Engineering, Brown University, Providence, RI 02912 (United States)

Description

Incipient plasticity in Mg single crystals was investigated using the pop-ins generated during spherical nanoindentation on (0 0 0 1), (1 0 −1 2) and (1 0 −1 0) surfaces. Representative deformed regions extracted from underneath indents by means of focused ion beam machining were examined by transmission electron microscopy (TEM) to identify the deformation mechanisms. Anisotropic elastic Hertzian contact theory was used to calculate indentation Schmid factors and the relevant resolved shear stresses at pop-in from the load–displacement curves. The pop-in statistics in conjunction with the TEM analysis showed that the most likely deformation mechanism responsible for pop-in is slip via 〈a〉 dislocations even in the case of indentation along the c-axis

Availability note (English)

Available from http://dx.doi.org/10.1016/j.actamat.2013.01.055

Additional details

Identifiers

DOI
10.1016/j.actamat.2013.01.055;
PII
S1359-6454(13)00094-3;

Publishing Information

Journal Title
Acta Materialia
Journal Volume
61
Journal Issue
8
Journal Page Range
p. 2953-2965
ISSN
1359-6454
CODEN
ACMAFD

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
45038207
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
DEFORMATION; DISLOCATIONS; ION BEAMS; MONOCRYSTALS; PLASTICITY; SLIP; STRESSES; SURFACES; TRANSMISSION ELECTRON MICROSCOPY
Descriptors DEC
BEAMS; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; CRYSTALS; ELECTRON MICROSCOPY; LINE DEFECTS; MECHANICAL PROPERTIES; MICROSCOPY

Optional Information

Copyright
Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.