Published August 1996 | Version v1
Journal article

Set-up of a small instrument using TXRF with high sensitivity

  • 1. Yantai Univ. (China). Dept. of Physics
  • 2. Academia Sinica, Lanzhou, GS (China). Inst. of Modern Physics

Description

An analytical instrument using total reflection X-ray fluorescence (TXRF) technique with a small size and high sensitivity is developed. The X-ray tubes with Cu, Mo and W anodes are employed respectively as exciting source. Two double total reflection units with special optical path are designed. Minimum detection limits (MDL) at 0.007 ng, 0.004 ng and 0.08 ng are reached in the condition of 6 mA exciting beam and 25 kV Cu anode, 45 kV Mo anode and 50 kV anode respectively

Additional details

Publishing Information

Journal Title
Journal of Nuclear and Radiochemistry
Journal Volume
18
Journal Issue
3
Journal Page Range
p. 158-163.
ISSN
0253-9950
CODEN
HHHHDH