Modeling of coupled edge stochastic and core resonant magnetic field effects in diverted tokamaks
Creators
Description
Attaining the highest possible performance in poloidally diverted tokamaks requires resonant magnetic perturbation coils to avoid core instabilities such as locked, resistive wall and neoclassical tearing modes. These coils also perturb the pedestal and edge region, causing varying degrees of stochasticity with remnant islands. In this paper, the effects of the DIII-D locked mode control coils are modeled with a field line integration code and compared with experimental measurements. We find that without a detailed profile analysis and field line integration modeling, it is difficult to establish whether a given response is due to a 'core mode' or an 'edge stochastic boundary effect'. We also find in diverted Ohmic plasmas, stochastic boundary layers display many characteristics associated with edge stochasticity in non-diverted tokamaks but can have significant differences such as a 'focusing' of the open magnetic field lines into the divertor
Additional details
Identifiers
- PII
- S0022311502014988;
Publishing Information
- Journal Title
- Journal of Nuclear Materials
- Journal Volume
- 313-316
- Journal Issue
- 3-4
- Journal Page Range
- p. 1282-1286
- ISSN
- 0022-3115
- CODEN
- JNUMAM
Conference
- Title
- 15. international conference on plasma-surface interactions in controlled fusion devices
- Acronym
- PSI-15
- Dates
- 26-31 May 2002
- Place
- Gifu (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 34051122
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DOUBLET-3 DEVICE; MAGNETIC FIELDS; PLASMA SCRAPE-OFF LAYER; PLASMA SIMULATION; POLOIDAL FIELD DIVERTORS; STOCHASTIC PROCESSES
- Descriptors DEC
- BOUNDARY LAYERS; CLOSED PLASMA DEVICES; DIVERTORS; LAYERS; SIMULATION; THERMONUCLEAR DEVICES; TOKAMAK DEVICES
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.