Measurement on X-ray stress constant of beryllium

The X-ray stress constants of the five crystalline planes of beryllium are measured using cantilever beam loading method on X2001 stress analyzer. The results show that the X-ray stress constant of each plane in beryllium is difference, so the X-ray stress constant corresponding to the diffraction plane must be adopted in order to acquire the exact stress value in the X-ray stress analysis. Due to the large penetration depth of X-ray in beryllium, the effect of the penetration depth on the X-ray stress constant measuring must be taken into account. (orig.)