Preparation of high quality spray-deposited fluorine-doped tin oxide thin films using dilute di(n-butyl)tin(iv) diacetate precursor solutions
- 1. Graduate School of Science and Technology, Shizuoka University, 3-5-1 Johoku, Naka-ku, Hamamatsu (Japan)
- 2. SPD Laboratory Inc, Hi-Cube 3-1-7, Wajiyama, Naka-ku, Hamamatsu (Japan)
Description
Fluorine-doped tin oxide (FTO) thin films were prepared, at different substrate temperatures, using dilute precursor solutions of di(n-butyl)tin(iv) diacetate (0.1 M DBTDA) by varying the F− concentration in the solution. It is noticed that conductivity of FTO film is increasing by increasing the fluorine amount in the solution. Morphology of SEM image reveals that grain size and its distribution are totally affected by the substrate temperature in which conductivity is altered. Among these FTO films, the best film obtained gives an electronic conductivity of 31.85 × 102 Ω−1 cm−1, sheet resistance of 4.4 Ω/□ (ρ = 3.14 × 10−4 Ω cm) with over 80% average normal transmittance between the 400 and 800 nm wavelength range. The best FTO film consists of a large distribution of grain sizes from 50 nm to 400 nm range and the optimum conditions used are 0.1 M DBTDA, 0.3 M ammonium fluoride, in a mixture of propan-2-ol and water, at 470 °C substrate temperature. The large distribution of grain sizes can be easily obtained using low DBTDA concentration (∼ 0.1 M or less) and moderate substrate temperature (470 °C). - Highlights: ► F-doped SnO2 (FTO) thin films prepared using di(n-butyl)tin(iv) diacetate (DBTDA). ► Substrate temperature and DBTDA concentration affect grain size and distribution. ► Large distribution of grain sizes can optimize the conductivity of FTO film. ► 0.1 M DBTDA, substrate temperature of 470 °C allows a large grain size distribution
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2012.06.068Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2012.06.068;
- PII
- S0040-6090(12)00778-X;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 520
- Journal Issue
- 22
- Journal Page Range
- p. 6813-6817
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44103586
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- AMMONIUM FLUORIDES; DISTRIBUTION; DOPED MATERIALS; ELECTRICAL PROPERTIES; FLUORINE; GRAIN SIZE; MORPHOLOGY; OPTICAL PROPERTIES; PRECURSOR; PYROLYSIS; SCANNING ELECTRON MICROSCOPY; SPRAYS; THIN FILMS; TIN COMPLEXES; TIN OXIDES; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- AMMONIUM COMPOUNDS; AMMONIUM HALIDES; CHALCOGENIDES; CHEMICAL REACTIONS; COHERENT SCATTERING; COMPLEXES; DECOMPOSITION; DIFFRACTION; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; ELEMENTS; FILMS; FLUORIDES; FLUORINE COMPOUNDS; HALIDES; HALOGEN COMPOUNDS; HALOGENS; MATERIALS; MICROSCOPY; MICROSTRUCTURE; NONMETALS; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; PHYSICAL PROPERTIES; SCATTERING; SIZE; SPECTROSCOPY; THERMOCHEMICAL PROCESSES; TIN COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.