Characterization of CCD systems for micro-tomography with X-ray synchrotron radiation

Published 2012 | Version v1

Journal article Metadata-only

1. Helmholtz-Zentrum Geesthacht, Max-Planck-Strasse 1, 21502 Geesthacht (Germany)

no abstract available

Additional details

Original title (German): Charakterisierung von CCD Systemen fuer Mikro-Tomographie mit Roentgen-Synchrotronstrahlung

Journal Title: Verhandlungen der Deutschen Physikalischen Gesellschaft
Journal Issue: Berlin 2012 issue
Series: Also available as printed version: Verhandlungen der Deutschen Physikalischen Gesellschaft v. 47(4)
Journal Page Range: [1 p.]
ISSN: 0420-0195
CODEN: VDPEAZ

Title: 76. annual conference of the DPG and DPG Spring meeting 2012 of the condensed matter section (SKM) with further DPG divisions environmental physics, microprobes, radiation and medical physics, as well as the DPG working groups energy, equal opportunities, industry and business, information, philosophy of physics, physics and disarmament, young DPG
Dates: 25-30 Mar 2012
Place: Berlin (Germany)

Country of Publication: Germany
Country of Input or Organization: Germany
INIS RN: 45021953
Subject category: S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator: Conference, No Abstract
Descriptors DEI: CAMERAS; CHARGE-COUPLED DEVICES; OPTIMIZATION; PHOTON COMPUTED TOMOGRAPHY; POSITION SENSITIVE DETECTORS; RESPONSE FUNCTIONS; SEMICONDUCTOR DETECTORS; X-RAY DETECTION
Descriptors DEC: COMPUTERIZED TOMOGRAPHY; DETECTION; DIAGNOSTIC TECHNIQUES; FUNCTIONS; MEASURING INSTRUMENTS; RADIATION DETECTION; RADIATION DETECTORS; SEMICONDUCTOR DEVICES; TOMOGRAPHY