Published June 11, 2008
| Version v1
Journal article
The X-ray sensitivity of semi-insulating polycrystalline CdZnTe thick films
Creators
- 1. Department of Display and Semiconductor Physics, Korea University, 208 Jochiwon Yeongigun, Chung Nam 339-700 (Korea, Republic of)
Description
The X-ray sensitivity is one of the important parameters indicating the detector performance. The X-ray sensitivity of semi-insulating polycrystalline CdZnTe:Cl thick films was investigated as a function of electric field, mean photon energy, film thickness, and charge carrier transport parameters and, compared with another promising detector materials. The X-ray sensitivities of the polycrystalline CdZnTe films with 350 μm thickness were about 2.2 and 6.2 μC/cm2/R in the ohmic-type and Schottky-type detector at 0.83 V/μm, respectively
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2008.03.057Additional details
Identifiers
- DOI
- 10.1016/j.nima.2008.03.057;
- PII
- S0168-9002(08)00438-5;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 591
- Journal Issue
- 1
- Journal Page Range
- p. 206-208
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- 9. international workshop on radiation imaging detectors
- Dates
- 22-26 Jul 2007
- Place
- Erlangen (Germany)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40033978
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CHARGE CARRIERS; ELECTRIC FIELDS; FILMS; PERFORMANCE; PHOTONS; POLYCRYSTALS; SENSITIVITY; THICKNESS; X RADIATION
- Descriptors DEC
- BOSONS; CRYSTALS; DIMENSIONS; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; IONIZING RADIATIONS; MASSLESS PARTICLES; RADIATIONS
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.