Published August 1980
| Version v1
Journal article
Fitting techniques for K X-ray multiplets in Ge(Li) spectra
Creators
- 1. Guelph Univ., Ontario (Canada). Dept. of Physics
Description
Two approaches are used to fit Ksub(α) X-ray doublets at high Z recorded in Ge(Li) spectra. They are based respectively on the use of analytic approximations to the Voigt integral and on direct numerical convolution of the gamma-ray response function with a Lorentzian. Excellent fits are obtained in both cases. Atomic physics applications of the technique are indicated. (orig.)
Additional details
Publishing Information
- Journal Title
- Nucl. Instrum. Methods
- Journal Volume
- 174
- Journal Issue
- 3
- Series
- Nucl. Instrum. Methods.
- Journal Page Range
- 549-553
- ISSN
- 0029-554X
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 12573889
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- DATA PROCESSING; ENERGY RESOLUTION; GAUSS FUNCTION; LEAST SQUARE FIT; LI-DRIFTED GE DETECTORS; LINE WIDTHS; RESPONSE FUNCTIONS; X-RAY SPECTRA; X-RAY SPECTROSCOPY
- Descriptors DEC
- FUNCTIONS; GE SEMICONDUCTOR DETECTORS; LI-DRIFTED DETECTORS; MAXIMUM-LIKELIHOOD FIT; MEASURING INSTRUMENTS; NUMERICAL SOLUTION; RADIATION DETECTORS; RESOLUTION; SEMICONDUCTOR DETECTORS; SPECTRA; SPECTROSCOPY