Spectrophotometric analysis in films a-Si: H a-nk-C: H

In this work, the IR absorption spectra of films in the energy range of 0.03-3.0 eV are investigated. Optical absorption coefficients of films for weakly and strongly absorbing regions of the spectrum, as well as refractive indices (n) and attenuation coefficients for various transparent and nontransparent substrates. In world science, sufficient research was conducted in the direction of measuring and studying thin films. However, in the direction of measuring interference and calculating optical absorption is not obtained specific formulas that could simplify results of experimental work. In this paper, a brief analysis was conducted published numerous articles and obtained calculations that improve the work researchers. Si films and their alloys are characterized by different structural phases. The most interesting of them are crystalline grains, which are located in amorphous matrix.